Paranthaman M.P., Tomsic M., Rindfleisch M., Sefat A.S., Mitchell J.E., Hillesheim D.A., Bridges C.A., Gofryk K.
Aytug T., Christen D.K., Paranthaman M.P., Leonard K.J., Thompson J.R., Xiong X., Selvamanickam V., Wee S.H., Zuev Y.L., Polat O., Sinclair J.W., Ertugrul M.
Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Miller D.J., Maroni V.A., Specht E.D., Paranthaman M., Aytug T., Cantoni C., Zhang Y., Zuev Y., Kropf A.J., Chen Z.*21, Zaluzec N.
Rupich M.W., Thieme C., Li X., Paranthaman M.P., Sathyamurthy S., Kim K., List F.A., Zhang Y., Qiu X.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, buffer layers, MOD process, substrate Ni-W, texture, critical caracteristics, Jc/B curves, fabrication
Paranthaman M., Aytug T., Christen D.K., Thompson J.R., Kim K., Selvamanickam V., Polat O., Qiu X., Lupini A.R., Meyer H.M.
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductors, fibers, RABITS process, buffer layers, IBAD process, substrate Ni-W, planarization, presentation
Ключевые слова: patents, HTS, coated conductors, buffer layers, fabrication, doping effect, YBCO, substrate Ni-W, MOD process
Maroni V.A., Goyal A., Specht E.D., Paranthaman M., Aytug T., Christen D.K., Kim K., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, fabrication, RABITS process, substrate Ni-W, MOD process, microstructure
Maroni V.A., Goyal A., Paranthaman M., Aytug T., Heatherly L., Kim K., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication
Ключевые слова: patents, chemical solution deposition, fabrication, template layers, texture, HTS, coated conductors, YBCO
Goyal A., Paranthaman M., Lee D., Aytug T., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y., Specht E.
Goyal A., Specht E.D., Aytug T., Christen D.K., Paranthaman M.P., Thompson J.R., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L., Sinclair J.W.
Ключевые слова: patents, HTS, coated conductors, buffer layers, fabrication, YBCO, substrate Ni-W, Jc/B curves, critical caracteristics
Ключевые слова: presentation, economic analysis, HTS, coated conductors
Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Kim K., Zhang Y., Ijaduola A.O., Tuncer E.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, MOD process, seed layers, RABITS process, texture, microstructure, fabrication
Ключевые слова: HTS, coated conductors, substrate Ni-W, buffer layers, manganites, MOD process, fabrication
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, fabrication, microstructure, buffer layers, high rate process, critical current, thickness dependence, oxygenation treatments, REBCO, magnetic field dependence, critical current density, Jc/B curves, angular dependence, texture, nanodots, pinning, critical caracteristics
Ключевые слова: presentation, HTS, YBCO, coated conductors, substrate metallic, RABITS process, mechanical properties, films epitaxial, buffer layers, IBAD process, template layers, MOD process, PVD process, comparison, seed layers, texture, substrate Ni-W, joints, microstructure, critical current, magnetic field dependence, PLD process, critical caracteristics, fabrication
Martin P., Paranthaman M., Thompson J.R., Kang S., Li J., Goyal A.(goyala@ornl.gov), Ijaduola A.
Rupich M.W., Li X., Zhang W., Kodenkandath T., Goyal A., Aytug T., Paranthaman M.P., Leonard K.J., Sathyamurthy S., Bhuiyan M.S., Kim K., Martin P.M., Li J., Fayek M.
Rupich M.W., Li X., Zhang W., Kodenkandath T., Goyal A., Specht E.D., Paranthaman M., Martin P.M., Li J., Gapud A.
Zhang W., Huang Y., Li X., Kodenkandath T., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L., Siegal E., Holesinger T.G., Maiorov B., Civale L., Miller D.J., Maroni V.A., Li J., Martin P.M., Specht E.D., Goyal A., Paranthaman M.P.
Ключевые слова: HTS, YBCO, coated conductors multifilamentary, inkjet printing, ac losses, RABITS process, MOD process, experimental results, fabrication
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, substrate Ni-W, seed layers, comparison, texture, fabrication
Paranthaman M., Aytug T., Leonard K.J., Sathyamurthy S., Bhuiyan M.S., Kang S., Martin P.M., Hunt R.D.
Ключевые слова: solution techniques, nanoscaled effects, HTS, YBCO, nanodoping, pinning, fabrication, Jc/B curves, critical caracteristics
Ключевые слова: HTS, REBCO, RABITS process, nanodots, YBCO, comparison, Jc/B curves, angular dependence, experimental results, fabrication, critical caracteristics
Paranthaman M., Aytug T., Christen D.K., Thompson J.R., Kang S., Martin P.M., Varela M., Gapud A.A., Raitano J.M., Chan S.-W.
Ключевые слова: HTS, YBCO, films, substrate SrTiO3, buffer layers, nanoscaled effects, surface, pinning, Jc/B curves, angular dependence, critical current density, critical caracteristics
Ключевые слова: HTS, YBCO, TFA-MOD process, coated conductors, coating-pyrolysis process, inkjet printing, ac losses, fabrication, high rate process, experimental results
Ключевые слова: HTS, YBCO, coated conductors multifilamentary, filaments, geometry effects, ac losses, inkjet printing
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, buffer layers, review, MOCVD process, MOD process, magnetron sputtering, texture, reel-to-reel process, microstructure, presentation, fabrication
Kodenkandath T., Rupich M., Goyal A., Paranthaman M., Xu Y., Marken K., Chaudhuri T., Bhattacharya R., Bhattacharya R., Phok S.
Ключевые слова: HTS, coated conductors, buffer layers, electrodeposition, minimum quench energy, presentation, fabrication
Ключевые слова: HTS, coated conductors, chemical solution deposition, buffer layers, precursors, substrates, YBCO, Jc/B curves, review, critical caracteristics
Thieme C., Kodenkandath T., Siegal E., Rupich M., Paranthaman M., Sathyamurthy S., Selvamanickam V., Sauers I., Tuncer E., List F., Duckworth R., Demko J., Rey C., Bhuyian S., Ellis A., James R., Mallette M., Verebelyi C.T., Xie V.S.
Ключевые слова: HTS, YBCO, coated conductors, precursors, screen printing, fabrication, RABITS process, coated conductors multifilamentary, ac losses, stabilizing layers, stability, dielectrics, quench, normal zone propagation, breakdown characteristics, nanoparticles, coils solenoidal, plans, operational performance, presentation, power equipment
Paranthaman M., Christen D.K., Heatherly L., Thompson J.R., Kang S., Lee D.F., List F.A., Martin P.M., Gapud A.A., Li J., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, nanodots, defects columnar, angular dependence, temperature dependence, pinning, fabrication
Goyal A., Paranthaman M., Heatherly L., Martin P.M., Li J., Wee S.H.(wees@ornl.gov)
Thieme C.L., Li X., Kodenkandath T., Goyal A., Heatherly L., Sathyamurthy S., Martin P.M., Rupich M.W.(mrupich@amsuper.com), Paranthaman M.P.(paranthamanm@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, chemical solution deposition, substrate Ni-W, fabrication
Goyal A., Paranthaman M., Aytug T., Christen D.K., Heatherly L., Leonard K.J., Thompson J.R., Kang S., Martin P.M., Ijaduola A.O., Rusakova I., Meng R., Chu C.W.(cwchu@uh.edu)
Ключевые слова: HTS, YBCO, films, substrate metallic, substrate single crystal, nanoscaled effects, nanoscaled roughness, pinning, Jc/B curves, temperature dependence, pinning force, irreversibility fields, angular dependence, microstructure, experimental results, critical caracteristics, magnetic properties
Ключевые слова: patents, HTS, coated conductors, substrate metallic, REBCO, other HTS, buffer layers, magnetron sputtering, cap layers, PLD process, fabrication
Paranthaman M., Salama K., Kang S., Lee D.F., Bhuiyan M.S.(s9r@ornl.gov)
Ключевые слова: HTS, YBCO, substrate Ni-W, buffer layers, MOD process, barriers, cap layers, magnetron sputtering, PLD process, fabrication, texture, microstructure, Jc/B curves, critical caracteristics
Paranthaman M., Christen D.K., Cantoni C., Thompson J.R.(jrt@utk.edu), Sorge K.D., Kerchner H.R.
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Goyal A., Paranthaman M., Verebelyi D.T., Civale L., Maiorov B., Holesinger T.
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Goyal A., Verebelyi D.T., Paranthaman M.P., Sathyamurthy S., Bhuiyan M.S.
Aytug T., Christen D.K., Feenstra R., Zhang Y.(zhanngyf@utk.edu), ParansParanthaman M.
Ключевые слова: HTS, YBCO, films, substrate single crystal, precursors, TFA-MOD process, fluorine process, Jc/B curves, fabrication, experimental results, critical caracteristics
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F., List F.A., Cook S.W., Martin P.M., Rouleau C.M., Christen H.M.(christenhm@ornl.gov)
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F.(leedf@ornl.gov), List F.A., Cook S.W., Martin P.M., Christen H.M., Rouleau C.M.
Ключевые слова: HTS, YBCO, coated conductors, pulsed electron deposition, ex-situ process, RABITS process, precursors, Jc/B curves, fabrication, critical caracteristics
Specht E.D., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Kang S., List F.A., Martin P.M., Varela M., Pennycook S.J., Ijaduola A.O., Gapud A.A., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, films, nanodots, defects columnar, pinning, microstructure, Jc/B curves, anisotropy, fabrication, experimental results, critical caracteristics
Schoop U., Li X., Kodenkandath T., Rupich M., Goyal A., Paranthaman M., Sathyamurthy S., Lee D.F., Bhuiyan M.S.(bhuiyanms@ornl.gov), Payzant E.A.(payzanta@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, buffer layers, solution techniques, fabrication
Goyal A., Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Gapud A.A.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, seed layers, barriers, oxygen diffusion, Jc/B curves, fabrication, critical caracteristics
Rupich M.W., Thieme C., Li X., Kodenkandath T., Goyal A., Paranthaman M., Aytug T., Christen D.K., Budai J.D., Cantoni C., Gapud A.A., Schoop U.(uschoop@amsuper.com), Kim K.(kyz@ornl.gov)
Goyal A., Aytug T., Christen D.K., Paranthaman M.P., Cantoni C., Gapud A.A., Kim K.(kkim@mse.ufl.edu), Norton D.P.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, PLD process, substrate SrTiO3, texture, resistivity, temperature dependence, fabrication
Ключевые слова: HTS, coated conductor modules, substrate Ni-W, buffer layers, MOD process, texture, microstructure, films epitaxial, fabrication
Goyal A., Paranthaman M., Leonard K.J., Sathyamurthy S., Kroeger D.M., Lee D.F.(leedf@ornl.gov), Jr L.H., Yoo J., List F.A., Rutter N., Cook S.W., Martin P.M.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, RABITS process, fabrication, microstructure, critical current, experimental results, critical caracteristics, length
Goyal A., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Aytug T.(aytugt@ornl.gov), Gapud A.A.
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Kroeger D.M., Lee D.F., List F.A., Martin P.M., Cook S., Gapud A.A., Yoo J.(yooj@ornl.gov), Hsu H.S.
Verebelyi D.T.(dverebelyi@amsuper.com), Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Malozemoff A.P., Nguyen N., Siegal E., Buczek D., Lynch J., Scudiere J., Rupich M., Goyal A., Specht E.D., Martin P., Paranthaman M.
Goyal A., Paranthaman M., Aytug T., Salama K., Sathyamurthy S., Bhuiyan M.S., Kang S., Lee D.F., Payzant E.A.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, buffer layers, MOD process, microstructure, experimental results, fabrication, magnetic properties
Rupich M.W., Schoop U., Thieme C., Zhang W., Kodenkandath T., Nguyen N., Arendt P.N., Foltyn S.R., Verebelyi D.T., Li X.(xli@amsuper.com), Jowett M., Holesinger T.G., Aytug T., Christen D.K., Paranthaman M.P.
Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Malozemoff A.P., Nguyen N., Siegal E., Buczek D., Lynch J., Scudiere J., Goyal A., Paranthaman M., Verebelyi D.T., Jowett M., Rupich M.W.(mrupich@amsuper.com), Thompson E., Wang J.-., Li Q., Annavarapu S., Cui S., Fritzemeier L., Aldrich B., Craven C., Niu F., Schwall R.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, MOD process, critical current, fabrication, critical caracteristics
Arendt P.N., Foltyn S.R., DePaula R.F., Stan L., Groves J.R., Holesinger T.G., Aytug T., Christen D.K., Paranthaman M.P., Kang S., Feenstra R., Budai J.D.
Goyal A., Paranthaman M., Verebelyi D.T., Ekin J.W., Clickner C.C., Feenstra R., Cheggour N., Thieme C.L.H.
Goyal A., Paranthaman M.P., Cantoni C., Martin P.M., Christen H.M., Sathyamurthy S.(sathyamurths@ornl.gov), Zhai H-Y, Kung S.
Aytug T., Paranthaman M., Kang S., Zhai H.Y., Leonard K.J., Vallet C.E., Sathyamurthy S., Christen H.M., Goyal A., Christen D.K.
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